4.5.5.2 Environmental Failure Testing Procedures (Alternative 2)
All changes in this version
Title changed
Before · FIPS 140-2
Environmental Failure Testing Procedures (Alternative 2)
After · FIPS 140-3
Environmental Failure Testing Procedures (Alternative 2)
Control changed
Before · FIPS 140-2
Environmental failure testing (EFT) shall involve a combination of analysis, simulation, and testing of a cryptographic module to provide reasonable assurance that environmental conditions or fluctuations (accidental or induced) outside the module's normal operating ranges for temperature and voltage will not compromise the security of the module.
EFT shall demonstrate that, if the operating temperature or voltage falls outside the normal operating range of the cryptographic module resulting in a failure of the electronic devices or circuitry within the module, at no time shall the security of the cryptographic module be compromised.
The temperature range to be tested shall be from -100 ° to +200 ° Celsius (-150 ° to +400 ° Fahrenheit). The voltage range to be tested shall be from the smallest negative voltage (with respect to ground) that causes the zeroization of the electronic devices or circuitry to the smallest positive voltage (with respect to ground) that causes the zeroization of the electronic devices or circuitry, including reversing the polarity of the voltages.
Documentation shall specify the normal operating ranges of the cryptographic module and the environmental failure tests performed.
After · FIPS 140-3
Environmental failure testing (EFT) shall involve a combination of analysis, simulation, and testing of a cryptographic module to provide reasonable assurance that environmental conditions or fluctuations (accidental or induced) outside the module's normal operating ranges for temperature and voltage will not compromise the security of the module.
EFT shall demonstrate that, if the operating temperature or voltage falls outside the normal operating range of the cryptographic module resulting in a failure of the electronic devices or circuitry within the module, at no time shall the security of the cryptographic module be compromised.
The temperature range to be tested shall be from -100 ° to +200 ° Celsius (-150 ° to +400 ° Fahrenheit). The voltage range to be tested shall be from the smallest negative voltage (with respect to ground) that causes the zeroization of the electronic devices or circuitry to the smallest positive voltage (with respect to ground) that causes the zeroization of the electronic devices or circuitry, including reversing the polarity of the voltages.
Documentation shall specify the normal operating ranges of the cryptographic module and the environmental failure tests performed.